Download PDF by Ana Paula Pinto Correia, Pedro Miguel Cândido Barquinha,: A Second-Order ΣΔ ADC Using Sputtered IGZO TFTs

By Ana Paula Pinto Correia, Pedro Miguel Cândido Barquinha, João Carlos da Palma Goes

ISBN-10: 3319271903

ISBN-13: 9783319271903

ISBN-10: 331927192X

ISBN-13: 9783319271927

This books discusses the layout, electric simulation and structure of a 2nd-order ∑∆ analog-to-digital converter (ADC), utilizing oxide thin-film transistors (TFTs) know-how. The authors offer a unified view of fabrics technological know-how and electronics engineering, so one can consultant readers from either fields via key themes. to complete this objective, history relating to fabrics, gadget physics, characterization ideas, circuit layout and format is given including an in depth dialogue of experimental information. the ultimate simulation effects basically display the potential for the proposed circuit-level suggestions, which permits the implementation of sturdy and effort effective ADCs in keeping with oxide TFTs, for average resolutions and conversion-rates.

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1 Fabrication and Characterization Routes 19 Anode Substrate Substrate-target distance Target Cathode To vacuum pump Fig. 2 Schematic of sputtering process a magnetic field is created close to the target, confining electron movement. This reduces substrate bombardment and increases the probability of ionization close to the target, improving the growth rate [1]. Additionally, sputtering can be used with a reactive gas, replacing or adding to the inert gas. This approach, known as reactive sputtering, allows to produce, for instance, oxide thin films such as transparent conducting oxides (TCOs) or transparent semiconducting oxides (TSOs) starting from metallic targets, by using oxygen as reactive gas.

5–40 keV) is directed to the sample and the interactions mentioned above are used to form an image by scanning the sample surface and recording the intensities in different detectors. In a conventional SEM, a secondary electrons detector is used and it provides relevant information about topography of the sample. In fact, the number of secondary electrons emitted is dependent on the angle formed between the beam and the peculiarities of surface sample, giving a surface topography analysis. Furthermore, taking into account that backscattered electrons emitted from heavy elements appear brighter in the image than the light elements, a chemical composition analysis can be obtained with a suitable detector [11].

D. thesis, 2010 2. Q. Chiang, Development of oxide semiconductors: materials, devices, and integration. D. thesis, Oregon State University, 2007 3. H. , ed. by K. Seshan (William Andrew Publishing, Oxford, 2012), pp. 55–88 4. C.

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A Second-Order ΣΔ ADC Using Sputtered IGZO TFTs by Ana Paula Pinto Correia, Pedro Miguel Cândido Barquinha, João Carlos da Palma Goes

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